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Mots clés
Acoustic propreties of solid
3C-SiC
18O
Thin films
Isotopic Tracing
SiC
Annealing
Evaluation
7550Pp
ADSORPTION DESORPTION HYSTERESIS
Photoluminescence
Hysteresis
Multilayer
2H
15N
8140Ef
Al2O3
HfO2
Periodic multilayer
XPS
Magnetic semiconductors
Adsorption Isotherms
Nuclear reaction analysis
Stable isotopic tracing
Adsorbed layers
Indium oxide
Magnetic anisotropy
Magnetization curves
Silicon carbide
Epitaxy
17Op
Oxygen deficiency
Channeling
Silica
Transparent conductive oxide TCO
Alloy
ALD
Ageing
27Aldp
Silicon
Gold
Topological defects
Alloys
PIXE
Passivation
Ferromagnetic resonance
Atomic Layer Deposition ALD
Thin film
Nickel
18O resonance
Low energy electron diffraction LEED
Nuclear resonance profiling NRP
AFM
Acoustic
Raman spectroscopy
7630Lh
17Opp
Charge exchange
Rutherford backscattering spectrometry RBS
Growth
Aluminum
Measurement
Pulsed laser deposition
Silicon Carbide
Sputtering
Defects
NRP
Nitridation
Density functional theory
27Alda
Capillary condensation
Gallium oxide
GaMnAs
Auger electron spectroscopy AES
6855Jk
Metal-insulator transition
XRD
Diffusion
17O
7550Ee
Adsorption
EPR
Energy loss
Nanoparticles
Oxidation
Nanostructures
Pb centers
Interface defects
X-ray diffraction
Epitaxial growth
Ion beam analysis
Zinc oxide
Topological insulators
Aluminium
AC susceptibility
Ion implantation
RBS
Kossel diffraction
27Ald p&α
13C