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NEXAFS Atomic force microscopy Optical properties Sputtering AlN Band alignment C Photoelectron spectroscopy Magnetron sputtering Thin film AZO thin films Carbon Ablation laser Buffer Couple Biofilms microbiens Bipolar resistive switching BRS B2 Semiconducting indium compounds Alzheimer's disease Anatase Titanium dioxide CIGSe Rutile Transmission electron microscopy Transfert d'énergie BOMBARDMENT Avalanche breakdown 3 nm in size Mott insulators Atomic layer etching Mott insulator Bixbyite B Chemical synthesis Integrated optics Spectroscopic ellipsometry Biomembranes A1 Characterization B3 Solar cells Optical interferometry Semiconductors CH4 Adsorption CNTs’ collapse TEM Low-pressure plasma processing Residual stress Films XPS B1 Inorganic compounds Oxides CaTiO3Pr^3^+ Thin films Kirkendall effect Chalcogenide Amyloid precursor Vanadium Sesquioxide Selenization X-ray diffraction Carbon Nanotube Functionalization Nanocomposite PECVD A Multilayers A-CNx Etching Amorphous Argon InP chlorine etching inductive coupled plasma ICP modeling plasma sheath simulation Scanning electron microscopy AuCu alloy Aryl-diazonium salts Calcined clay Optical waveguides Aluminium nitride Physical vapor deposition Copper Annealing Biocapteurs V2O3 Mass spectrometry Applications industrielles Resistive switching TiO2 Plasma etching A3 Physical vapor deposition processes A Chalcogenides Sol-gel CHLORINE PLASMAS X-ray photoelectron spectroscopy B2 Quaternary Plasmas froids Nanotubes Structure SF 6 Band gap Alloying Non-volatile memory Ambipolar material Colloidal solution Capacitance B2 Semiconducting alloys Biomasse A Thin films